详情
特点
- Line times down to 40 µs
- Binning mode (half the number of effective channels) for faster readout speed down to 20 µs
- Selectable parameters: input charge range, holes or electrons polarity, detector timing, low-pass filter time constant and line time
- Up to three different internal charge pump cycles for offset adjusting, signal emulation and switch charge injection compensation
- Two power modes in addition to sleep and full power-down modes
- Correlated Double Sampling for offset subtraction with programmable time constant
优势
- Flexible programming options to optimize for application needs
- Suitable to a wide range of detector sizes, supporting line capacitances up to 200 pF
- Best-in-class figure of merit for noise, power consumption and speed
- High-speed for dynamic applications
- Ultra-low power for portable applications
- Low-noise for great image quality
- Accurate temperature feedback
- Chip-on-flex packaging suitable to ACF bonding on the detector side and to a low-cost standard connector on the PCB side
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产品规格书
Short datasheet
技术文档
Factsheet
环境文档
RoHS certificate
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更多 计算机断层扫描ct与x射线传感器
借助高品质的传感解决方案,CT与X射线传感器设备能够以更高对比度呈现更精确的图像,同时限制了噪点和失真的出现。