Material identification & inspection

Material Identification & Inspection is at the heart of our advanced solutions, designed to deliver precise and reliable results across various applications. At ams OSRAM, we are committed to innovation and excellence, providing cutting-edge technology for your needs 

Our active & passive spectroscopy component offering allows for innovative analysis setups, which make material characterization better performing and more cost efficient than conventional image-processing based approaches. They achieve detection levels previously only available via high-cost spectrometers. The combination of the industries spectrally broadest portfolio of high precision LEDs in UV, VIS and NIR spectrum, highly sensitive photodetectors with defined spectral filtering capabilities and our high-performance. Analog Front Ends enables our customers to build-up highly modular and fully scalable spectral analysis solutions with outstanding signal-to-noise ratio (SNR) . For passive spectroscopy our integrated multi-channel spectral sensors, optionally paired with e.g. broad-spectrum white LEDs,  allow for out-of-the-box spectral analysis setups covering spectral ranges from UV-A/B/C, visible and near-infrared (NIR) light spectrum to ensuring accurate and comprehensive spectral measurements at defined ranges. 

Hyperspectral Imaging: Our hyperspectral imaging products feature stable LED drivers, precise color LEDs, and bright white LEDs. The CMOS Image Sensor (Mira) offers high-resolution imaging, capturing detailed and accurate hyperspectral data. 

Metal and Magnetic Material Detection: Detect metal and magnetic materials with our precise inductive position sensors and high-sensitivity magnetic sensors. These components provide reliable and accurate detection for various industrial applications. 

Impedance Spectroscopy: Our capacitive sensors are designed for high precision and sensitivity, making them ideal for impedance spectroscopy. They deliver accurate and reliable measurements essential for detailed analysis.