Details
Features
- 512-channel in 15 x 23 mm² FBGA package
- Ultra-low noise of 0.29 fC at 0.5 μA input current in low noise mode
- Lowest power dissipation of 1.25 mW per channel in low power mode
- Adjustable integration time down to 51 μs (20 kSPS) at 20-bit resolution. Up to 26-bit at integration times of 1 ms
- Zero biased photodiodes (true ground concept) for ultra-low dark currents
- Integral linearity of ±0.080% of reading and ±0.2 ppm of full-scale range (all channels active)
- Automatic zero offset calibration, input charge calibration and linearity calibration
Benefits
- No external components required. Integrated capacitors for supply and reference decoupling
- No charge loss. Continuous charge integration due to zero dead time of ADC architecture
- Selectable full-scale range of 0.5 μA in low range and 1 μA in high range
- Adjustable full-scale range, integration time and power consumption via SPI interface as well as adjustable output modes via LVDS
- Selectable power supply concept between dual ±1.5 V analog supply (true ground concept) or single +3.0 V analog supply
- On-chip LDOs, voltage references and temperature sensor
- Built-in diagnostic modes for testing full detector signal chain
Parameters
Channels
input
512
Integration time
min.
51
µs
Input related noise
0.29
Power consumption per channel
min.
1.25
mW
Resolution
26
bit
Package
FBGA (23 x 15mm)
Function
x-ray sensing
Application fields
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Datasheets
Short datasheet
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